Browsing Física (Mag.) by Subject "Semiconductores de óxido metálico"
Now showing items 1-1 of 1
-
Comparison and evaluation of measured and simulated high-frequency capacitance-voltage curves of MOS structures for different interface passivation parameters
(Pontificia Universidad Católica del PerúPE, 2019-06-27)Semiconductor-insulator interfaces play an important role in the performance of many different electronic and optoelectronic devices such as transistors, LEDs, lasers and solar cells. Particularly, the recombination of ...