Statistics for Structural, luminescence and Judd-Ofelt analysis to study the influence of post-annealing treatment on the AIN:Tb thin films prepared by radiofrequency magnetron sputtering
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| Structural, luminescence and Judd-Ofelt analysis to study the influence of post-annealing treatment on the AIN:Tb thin films prepared by radiofrequency magnetron sputtering | 1 |
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| TUCTO_KAREM_LUMINISCENCIA_ESPECTROMETRÍA.pdf | 3 |