Statistics for Structural, luminescence and Judd-Ofelt analysis to study the influence of post-annealing treatment on the AIN:Tb thin films prepared by radiofrequency magnetron sputtering
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Structural, luminescence and Judd-Ofelt analysis to study the influence of post-annealing treatment on the AIN:Tb thin films prepared by radiofrequency magnetron sputtering | 0 |
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TUCTO_KAREM_LUMINISCENCIA_ESPECTROMETRÍA.pdf | 1 |