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    Determinación de las constantes ópticas y el espesor de películas delgadas semiconductoras depositadas por pulverización catódica de radio frecuencia sobre substratos ligeramente abosorbentes en la región visibles 

    Tucto Salinas, Karem Yoli (Pontificia Universidad Católica del Perú, 2013-02-05)
    En este trabajo se describe el método de Swanepoel (1983) [1] y el método propuesto por Guerra J A (2010) [2] para caracterizar películas delgadas usando sólo el espectro de transmitancia óptica. La película es caracterizada ...
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    Structural, luminescence and Judd-Ofelt analysis to study the influence of post-annealing treatment on the AIN:Tb thin films prepared by radiofrequency magnetron sputtering 

    Tucto Salinas, Karem Yoli (Pontificia Universidad Católica del Perú, 2016-06-20)
    This thesis investigates the effects of the annealing treatments on the spontaneous emission, radiative lifetime, composition and structure of terbium doped aluminum nitride films deposited on silicon substrates by radio ...
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    Optical and luminiscent properties of terbium / ytterbium doped aluminum oxynitride and terbium doped aluminum nitride thin films 

    Tucto Salinas, Karem Yoli (Pontificia Universidad Católica del Perú, 2020-08-06)
    In the present thesis the optical and light emission properties of two systems consisting of Tb3+ and Yb3+ doped amorphous AlOxNy thin films and Tb3+ doped polycrystalline AlN thin films were analyzed. In the two ions system, ...

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    Tucto Salinas, Karem Yoli (3)
    Subjecthttps://purl.org/pe-repo/ocde/ford#1.03.00 (2)Películas delgadas--Análisis estructural (2)Espectrometría (1)https://purl.org/pe-repo/ocde/ford#2.05.01 (1)Luminiscencia (1)... View MoreDate Issued2013 (1)2016 (1)2020 (1)AdvisorWeingärtner, Roland (2)Grieseler, Rolf (1)Guerra Torres, Jorge Andrés (1)xmlui.ArtifactBrowser.AdvancedSearch.type_degreeDoctorado (1)Maestría (1)Título Profesional (1)

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