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    FEM simulation of residual stresses of thin films for applications in MEMS 

    Macavilca Román, José Carlos (Pontificia Universidad Católica del Perú, 2017-06-19)
    In MEMS sensors, such as resonators based on cantilever and doubly-clamped beams, the presence of residual stresses in the thin films disrupt their mechanical properties or eigenfrequencies and, in some cases, can destroy ...

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    Macavilca Román, José Carlos (1)
    SubjectMétodo de elementos finitos (1)Películas delgadas (1)
    Sistemas microelectromecánicos (1)
    ... View MoreDate Issued2017 (1)Advisor
    Rumiche Zapata, Francisco (1)
    Ströhla, Tom (1)xmlui.ArtifactBrowser.AdvancedSearch.type_degree
    Maestría (1)

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