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    Construction and implementation of a 4-probe measuring system to determinate the temperature dependent sheet resistance of thin films 

    Pacheco Arenas, Carlos Arturo (Pontificia Universidad Católica del Perú, 2017-04-12)
    In order to build machines, electronic devices, it is necessary to know all properties of the materials. The machines and electronic devices use parts that are interconnected, the mechanical properties are important, but ...
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    FEM simulation of residual stresses of thin films for applications in MEMS 

    Macavilca Román, José Carlos (Pontificia Universidad Católica del Perú, 2017-06-19)
    In MEMS sensors, such as resonators based on cantilever and doubly-clamped beams, the presence of residual stresses in the thin films disrupt their mechanical properties or eigenfrequencies and, in some cases, can destroy ...

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    AuthorMacavilca Román, José Carlos (1)Pacheco Arenas, Carlos Arturo (1)Subject
    Películas delgadas (2)
    Método de elementos finitos (1)Resistencia eléctrica (1)Sistemas microelectromecánicos (1)Temperatura-Medición (1)... View MoreDate Issued2017 (2)Advisor
    Rumiche Zapata, Francisco (2)
    Ströhla, Tom (2)xmlui.ArtifactBrowser.AdvancedSearch.type_degree
    Maestría (2)

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